Nanowerk11mon
Understanding Scanning Probe Microscopy for Nanoscale Analysis
Definition: Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM is instrumental in the analysis and ...
From liquid to solid: New technique uncovers disease-related changes in tiny droplets within our cells
Understanding the behavior of tiny droplets in our cells could aid the search for new treatments. A team of Leiden ...
Hackaday1y
Low-Cost DSP For Scanning Probe Microscopy
A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...
AZoNano13y
Scanning Probe Microscopes (SPM)
Scanning probe microscopes (SPMs) are used to create images of nanoscale surfaces and structures, possibly down to the atomic scale. These devices use a probe tip attached to the end of a cantilever ...
Hackaday4mon
scanning tunneling microscope
A geared stepper motor attached to the probe platform is set up to allow ... Continue reading “Building A 3D Printed Scanning Tunneling Microscope” → ...
AZOM7y
Electrochemical Scanning Probe Microscopy: Increased Control for MultiMode AFMs
Three powerful options are available with Bruker for performing electrochemical (EC) scanning probe microscopy: Electrochemical Scanning Tunneling Microscopy (ECSTM), Electrochemical Atomic Force ...
Nanowerk1y
Understanding Scanning Tunneling Microscopy for Precise Surface Analysis
Scanning Tunneling Microscopy is a subset of Scanning Probe Microscopy (SPM), a group of techniques that image and manipulate surfaces at the nanometer to atomic scales. SPM techniques share the ...
AZoNano8mon
Dimension XR - A Scanning Probe Microscope
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
Michigan Technological University5y
Veeco Nanoscope II AFM
Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...
Michigan Technological University5y
Veeco Dimension 3000 AFM
Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...
University of Bristol1y
Electron and scanning probe microscopy
The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale. The unit houses two scanning electron microscopes, two scanning probe microscopes and ...